Flexstar Announces the First Testing Solution for the Next Generation in Storage Devices, the Non-Volatile Memory Express (NVMe) 1.0C PCIe SSD
SAN JOSE, Calif., July 17, 2013 /PRNewswire/ — Flexstar Technology, Inc., the leading provider of test and measurement solutions for storage technology manufacturers, has announced the release of the industry’s first NVMe test systems and test suites for PCIe SSD
NVMe is an open source, standardized, low-latency host driver and set that operates over PCIe Gen 2.0 and Gen 3.0 communication protocols. Previous generation protocol stacks were geared specifically toward the architecture of Hard Disk Drives (HDDs) which led to longer transmission times in the issuing and sending of commands to the device. NVMe was specifically designed to optimize the performance of next generation SSDs.
NVMe also enables variable device throughputs of up to 8 Gb/s per lane through the specific PCIe lane architecture.
“With this NVMe testing solution our customers can bring their products to market with an assurance, of quality and reliability”: commented Michael Bellon, Flexstar’s Vice President of Engineering. “Our NVME solution is available on Flexstar’s Environmental, Burn-in and Bench-top systems and is downward compatible to PCIe Gen 2.0.”
NVMe includes the following key features:
- Extremely flexible command queue structure (64k queues with 64k entries each)
- Metadata about SSD specific performance is built into the standard
- Far superior support for the SATA TRIM command to identify old data blocks that can be reclaimed by the device
- Executes commands in less than half the number of clock cycles when compared to other protocols.